{"id":512,"date":"2025-12-30T22:38:00","date_gmt":"2025-12-30T22:38:00","guid":{"rendered":"https:\/\/roid422.mycafe24.com\/?page_id=512"},"modified":"2026-03-11T08:19:05","modified_gmt":"2026-03-11T08:19:05","slug":"2d-3d-aoi-%ea%b3%84%ec%b8%a1-%ea%b2%80%ec%82%ac-%ec%86%94%eb%a3%a8%ec%85%98","status":"publish","type":"page","link":"https:\/\/lloydcompany.co.kr\/?page_id=512","title":{"rendered":"2D\/3D AOI Inspection Solution"},"content":{"rendered":"

[vc_row][vc_column][vc_empty_space css=”.vc_custom_1766447043671{margin-top: 8% !important;}”][\/vc_column][\/vc_row][vc_row][vc_column offset=”vc_hidden-xs”][vc_separator css=””][vc_column_text css=”.vc_custom_1770018529295{margin-bottom: 25px !important;}”]2D\/3D AOI Metrology & Inspection Solution<\/strong><\/span>[\/vc_column_text][vc_column_text css=””]\uc8fc\uc2dd\ud68c\uc0ac \ub85c\uc774\ub4dc\ub294 \ub300\ub9cc CMIt\uc758 \uacf5\uc2dd \ub300\ub9ac\uc810\uc785\ub2c8\ub2e4.[\/vc_column_text][vc_separator css=””][\/vc_column][\/vc_row][vc_row][vc_column offset=”vc_hidden-lg vc_hidden-md vc_hidden-sm”][vc_separator css=””][vc_column_text css=”.vc_custom_1770018532792{margin-bottom: 25px !important;}”]2D\/3D AOI Metrology & Inspection Solution<\/strong><\/span>[\/vc_column_text][vc_column_text css=””]\uc8fc\uc2dd\ud68c\uc0ac \ub85c\uc774\ub4dc\ub294 \ub300\ub9cc CMIt\uc758 \uacf5\uc2dd \ub300\ub9ac\uc810\uc785\ub2c8\ub2e4.[\/vc_column_text][vc_separator css=””][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][\/vc_column][\/vc_row][vc_row][vc_column][vc_single_image image=”513″ img_size=”full” css=””][vc_column_text css=””]CMIt<\/span><\/strong><\/p>\n

CMIt\uc758 \uad11\ud559 \uce21\uc815 \uc7a5\ube44\ub294 \ub192\uc740 \uc218\uc900\uc758 2D\/3D \uac80\uc0ac \uce21\uc815\uc774 \uac00\ub2a5\ud55c AOI \uc7a5\ube44\uc785\ub2c8\ub2e4.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][vc_column_text css=””]<\/p>\n

\n\n\n\n\n\n
2D Inspection \u2013 TLI & PLR<\/th>\n<\/tr>\n
TLI (Total Light Integration)<\/th>\nPLR (Photoluminescence)<\/th>\n<\/tr>\n
\n
    \n
  • Designed especially for multi-layer RDL<\/li>\n
  • Minimizing underlying layer interference<\/li>\n
  • Suppressing metal surface roughness<\/li>\n<\/ul>\n

    \"TLI<\/td>\n

\n
    \n
  • Fluorescence inspection image contrast and high throughput<\/li>\n
  • Optimized for detecting residual organic materials in high aspect-ratio structures<\/li>\n<\/ul>\n

    \"PLR<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n

    [\/vc_column_text][vc_column_text css=””]<\/p>\n

    \n\n\n\n\n
    3D Metrology<\/th>\n<\/tr>\n
    \n
      \n
    • Full BH\/COP Measurement<\/li>\n
    • Thin Film THK Measurement<\/li>\n
    • Interferometric principle<\/li>\n
    • Die Shift Measurement<\/li>\n<\/ul>\n

      Confocal (CMIt)<\/strong><\/p>\n

      \"Confocal<\/td>\n

    		\n\n\n\n\n\n
    Bump Height<\/td>\n<\/td>\n<\/tr>\n
    Die Warpage \/ Die Shift<\/td>\n<\/td>\n<\/tr>\n
    Wafer Warpage<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n

    [\/vc_column_text][vc_column_text css=””]<\/p>\n

    \n\n\n\n\n
    Software & AI Solution<\/th>\n<\/tr>\n
    \"MOON<\/p>\n

    MOON<\/strong>
    \nMulti Orientation Optical Navigation<\/p>\n

    Moon System architecture and applications<\/td>\n

    		Inspection Hybrid Process<\/strong><\/p>\n

    \"AI<\/p>\n

    ACME<\/strong> \u2013 All-in-One AI Model Development Platform<\/p>\n

      \n
    • Quick Image Labeling \u2013 500 pcs < 5 min<\/li>\n
    • Friendly Training UI<\/li>\n
    • Immediate Model Test<\/li>\n<\/ul>\n

       <\/p>\n

      RADON<\/strong> \u2013 AI Re-judge System<\/p>\n

        \n
      • Reduce machine computation load<\/li>\n
      • Service Multi Machine<\/li>\n
      • Support Production Data Analysis and Review<\/li>\n
      • Reduce manual review workload<\/li>\n<\/ul>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n

        [\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space height=”52px”][\/vc_column][\/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1766708798476{margin-bottom: 5% !important;}”][\/vc_column][\/vc_row][vc_row][vc_column css=”.vc_custom_1766707612321{padding-top: 32px !important;padding-right: 32px !important;padding-left: 32px !important;background-color: #F7F7F7 !important;border-radius: 20px !important;}”][vc_column_text css=”.vc_custom_1773217119620{margin-bottom: 15px !important;}”]Argus \u3163 <\/strong>Multi-layer RDL (Interposer) Inspection System<\/span>[\/vc_column_text][vc_column_text css=””]Argus \uc2dc\uc2a4\ud15c\uc740 \ub2e4\uce35 RDL Interposer \uad6c\uc870\uc5d0 \ucd5c\uc801\ud654 \ub418\uc5b4 \uc815\ud655\ud55c \uacb0\ud568 \uac10\uc9c0 \ubc0f \uce21\uc815\uc744 \ubcf4\uc7a5 \ud569\ub2c8\ub2e4.
        \n\ud601\uc2e0\uc801\uc778 \uad11\ud559 \uc124\uacc4\uc640 \uc54c\uace0\ub9ac\uc998\uc744 \uac16\ucd98 Argus\ub294 \ud558\ubd80\uce35\uc758 \uac04\uc12d\uc744 \ud6a8\uacfc\uc801\uc73c\ub85c \ucd5c\uc18c\ud654 \ud558\uc5ec \uc911\uc694\ud55c \uacb0\ud568\uc744 \uc815\ubc00\ud558\uac8c \uc2dd\ubcc4\ud558\uc5ec advanced Packaging\uc758 \uc5c4\uaca9\ud55c \uc694\uad6c\uc0ac\ud56d\uc744 \ucda9\uc871 \ud569\ub2c8\ub2e4.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][\/vc_column][\/vc_row][vc_row][vc_column][vc_row_inner][vc_column_inner width=”2\/3″][vc_empty_space height=”12px”][vc_column_text css=””]<\/i> Product Feature<\/span><\/strong><\/p>\n

        \u00b7<\/span> <\/strong>Support 6″, 8″, 12″ WF & 310x310mm Panel
        \n\u00b7<\/span> <\/strong>Wafer Thickness Range : 400~2500\u339b.
        \n\u00b7<\/span> <\/strong>TLI for mult-layer RDL (10P10M, L=1.4\u339b)
        \n\u00b7<\/span> <\/strong>Optional \u03bcBump, COP metrology (Round bump CD<8\u339b) metrology
        \n\u00b7<\/span> <\/strong>Optional PLR, Optional fluorescence inspection
        \n\u00b7<\/span> <\/strong>Tool matching
        \n\u00b7<\/span> <\/strong>Maximum die size : 285 x 285mm.
        \n\u00b7<\/span> <\/strong>2D Sensitivity
        \n<\/i>BF : 0.7\u339b, DF : 0.25\u339b<\/span>
        \n\u00b7<\/span> <\/strong>3D Accuracy
        \n<\/i>Resolution : 20nm, Accuracy : 80nm<\/span>[\/vc_column_text][\/vc_column_inner][vc_column_inner width=”1\/3″][vc_single_image image=”545″ img_size=”full” alignment=”right” style=”vc_box_rounded” css=””][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][\/vc_column][\/vc_row][vc_row][vc_column css=”.vc_custom_1766707612321{padding-top: 32px !important;padding-right: 32px !important;padding-left: 32px !important;background-color: #F7F7F7 !important;border-radius: 20px !important;}”][vc_column_text css=”.vc_custom_1770018580185{margin-bottom: 15px !important;}”]Phantom \u3163 <\/strong>Large Panel Defect Inspection + 3D Bump Metrology<\/span>[\/vc_column_text][vc_column_text css=””]Phantom \uc2dc\ub9ac\uc988\ub294 \uac80\uc99d\ub41c Argus \uae30\ub2a5\uc744 \ub300\ud615 \ud328\ub110 application\uc73c\ub85c \ud655\uc7a5 \ud569\ub2c8\ub2e4.
        \n\ud32c\uc544\uc6c3 \ud328\ub110-\ub808\ubca8 \ud328\ud0a4\uc9d5, RDL \ud328\ub110 \uc5b4\ud50c\ub9ac\ucf00\uc774\uc158 \ubc0f \ud328\ub110 \ub808\ubca8 \uc778\ud130\ud3ec\uc800\/\ube0c\ub9ac\uc9c0 \uad6c\uc870\ub97c \ud3ec\ud568 \ud569\ub2c8\ub2e4.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][vc_row_inner][vc_column_inner width=”2\/3″][vc_empty_space height=”12px”][vc_column_text css=””]<\/i> Product Feature<\/span><\/strong><\/p>\n

        \u00b7<\/span> <\/strong>Panel Size Support : 510×515, 600×600, 700x700mm.
        \n\u00b7<\/span> <\/strong>Panel Thickness Range : 400~4000\u339b.
        \n\u00b7<\/span> <\/strong>High-warp capability : Handle panels w\/I warpage < 10mm.
        \n\u00b7<\/span> <\/strong>TLI for mult-layer RDL (10P10M, L\/S=2\/2\u339b)
        \n\u00b7<\/span> <\/strong>Optional \u03bcBump metrology.
        \n\u00b7<\/span> <\/strong>Optional fluorescence inspection.
        \n\u00b7<\/span> <\/strong>Mult-parameter scanning within a single cycle
        \n<\/i>Focus, magnifcation, ilumination, sensitivity, and detection engines.<\/span>[\/vc_column_text][\/vc_column_inner][vc_column_inner width=”1\/3″][vc_single_image image=”548″ img_size=”full” style=”vc_box_rounded” css=””][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][\/vc_column][\/vc_row][vc_row][vc_column css=”.vc_custom_1766707612321{padding-top: 32px !important;padding-right: 32px !important;padding-left: 32px !important;background-color: #F7F7F7 !important;border-radius: 20px !important;}”][vc_column_text css=””]TopoX \u3163 <\/strong>3D Surface profile and Thickness Metrology<\/span>[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][vc_row_inner][vc_column_inner width=”2\/3″][vc_empty_space height=”12px”][vc_column_text css=””]<\/i> Product Feature<\/span><\/strong><\/p>\n

        \u00b7<\/span> <\/strong>Support 6″, 8″, 12″ Full Wafer
        \n\u00b7<\/span> <\/strong>3D surface profiling and thickness measurement.
        \n\u00b7<\/span> <\/strong>Bow, Warp, TTV, LTV, Thickness
        \n\u00b7<\/span> <\/strong>High Throughput
        \n\u00b7<\/span> <\/strong>3D topography classification
        \n\u00b7<\/span> <\/strong>3D Resolution : 5\u339b
        \n\u00b7<\/span> <\/strong>3D Accuracy : 30nm[\/vc_column_text][\/vc_column_inner][vc_column_inner width=”1\/3″][vc_single_image image=”549″ img_size=”full” style=”vc_box_rounded” css=””][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row][vc_row][vc_column css=”.vc_custom_1766707612321{padding-top: 32px !important;padding-right: 32px !important;padding-left: 32px !important;background-color: #F7F7F7 !important;border-radius: 20px !important;}”][vc_column_text css=””]Buffalo \u3163 <\/strong>2D Die Saw Inspection<\/span>[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][vc_row_inner][vc_column_inner width=”2\/3″][vc_empty_space height=”12px”][vc_column_text css=””]<\/i> Product Feature<\/span><\/strong><\/p>\n

        \u00b7<\/span> <\/strong>Multi-mag inspection & metrology
        \n\u00b7<\/span> <\/strong>BF, DF and multi-wavelength illumination
        \n\u00b7<\/span> <\/strong>Chipping, crack, scratch, and probing mark inspection
        \n\u00b7<\/span> <\/strong>Non-patterning glass wafer insp.[\/vc_column_text][\/vc_column_inner][vc_column_inner width=”1\/3″][vc_single_image image=”550″ img_size=”full” style=”vc_box_rounded” css=””][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1766708798476{margin-bottom: 5% !important;}”][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space css=”.vc_custom_1766447043671{margin-top: 8% !important;}”][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"

        [vc_row][vc_column][vc_empty_space css=”.vc_custom_1766447043671{margin-top: 8% !important;}”][\/vc_column][\/vc_row][vc_row][vc_column offset=”vc_hidden-xs”][vc_separator css=””][vc_column_text css=”.vc_custom_1770018529295{margin-bottom: 25px !important;}”]2D\/3D AOI Metrology & Inspection Solution[\/vc_column_text][vc_column_text css=””]\uc8fc\uc2dd\ud68c\uc0ac \ub85c\uc774\ub4dc\ub294 \ub300\ub9cc CMIt\uc758 \uacf5\uc2dd \ub300\ub9ac\uc810\uc785\ub2c8\ub2e4.[\/vc_column_text][vc_separator css=””][\/vc_column][\/vc_row][vc_row][vc_column offset=”vc_hidden-lg vc_hidden-md vc_hidden-sm”][vc_separator css=””][vc_column_text css=”.vc_custom_1770018532792{margin-bottom: 25px !important;}”]2D\/3D AOI Metrology & Inspection Solution[\/vc_column_text][vc_column_text css=””]\uc8fc\uc2dd\ud68c\uc0ac \ub85c\uc774\ub4dc\ub294 \ub300\ub9cc CMIt\uc758 \uacf5\uc2dd \ub300\ub9ac\uc810\uc785\ub2c8\ub2e4.[\/vc_column_text][vc_separator css=””][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space][\/vc_column][\/vc_row][vc_row][vc_column][vc_single_image image=”513″ img_size=”full” css=””][vc_column_text css=””]CMIt CMIt\uc758 \uad11\ud559 \uce21\uc815 \uc7a5\ube44\ub294 \ub192\uc740 \uc218\uc900\uc758 2D\/3D \uac80\uc0ac \uce21\uc815\uc774 \uac00\ub2a5\ud55c AOI…<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":123,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-512","page","type-page","status-publish","hentry","description-off"],"yoast_head":"\n2D\/3D AOI Inspection Solution - 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